• High resolution X-ray photoelectron spectroscopy (Scienta ESCA 300 at Lehigh University and synchrotron beamline U12A at Brookhaven National Lab)
  • Optical spectroscopy
  • Wet etching technology
  • Thin film technology
  • Ceramic technology
  • Atomic force microscopy
  • Mechanical properties (microhardness, etc.)
  • Positron annihilation lifetime spectroscopy
  • Photoelectrical spectroscopy
  • EXAFS (beamlines X18B, X19A, X15B at Brookhaven National Lab)
  • NEXAFS (beamline U12A at Brookhaven National Lab)